Surface roughness of Ag film on the optical properties of metal- dielectric-metal film and super-resolution imaging

نویسندگان

  • H. Liu
  • B. Wang
  • E. S. P. Leong
  • J. Deng
  • M. S. Zhang
  • Y. J. Liu
  • A. Danner
  • S. A. Maier
  • J. H. Teng
چکیده

In this paper, we will discuss the seed layer assisted smooth Ag film deposition and the effect of the surface roughness on the surface plasmon resonance in thin Ag film, the reflectance spectra of Ag/MF2/Ag structure and the super-resolution imaging by using a Ag superlens. Ni is found to be the effective surfactant in forming smooth Ag film and enhanced surface plasmon resonance. The Ag films deposited with and without seed layer were applied to the near field superlens application. High image contrast and sub-50nm resolution imaging were demonstrated. The effect of surface morphology on the optical properties in metal-dielectric-metal (MDM) thin film was investigated and an empirical relationship was found between the optical properties and the Ag film structural properties.

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تاریخ انتشار 2011